Abstract: Defect pattern recognition (DPR) of wafer maps is critical for determining the root cause of production defects, which can provide insights for the yield improvement in wafer foundries.

Abstract: In Deep Image Prior (DIP), a Convolutional Neural Network (CNN) is fitted to map a latent space to a degraded (e.g. noisy) image but in the process learns to reconstruct the clean image.

Proteins are the machinery of life facilitating the key processes that drive living organisms. Recent advances have increased the number of experimentally resolved or computationally predicted ...

To address the difficulties in fusing multi-mode sensor data for complex industrial machinery, an adaptive deep coupling convolutional auto-encoder (ADCCAE) fusion method was proposed. First, the ...

We present a method for understanding the functional relationships among large populations of neurons in complex circuits such as the retina and primary visual cortex that allows a global comparison ...

Urban transportation destination prediction is a crucial issue in the area of intelligent transportation, such as urban traffic planning and traffic congestion control. The spatial structure of the ...

The control of general nonlinear systems is a challenging task in particular for large-scale models as they occur in the semi-discretization of partial differential equations (PDEs) of, say, fluid ...