Abstract: In this paper, we investigate the uplink sum rate maximization problem in an intelligent reflecting surface (IRS)-assisted multiple-input multiple-output (MIMO) non-orthogonal multiple ...
Abstract: Estimating the reliability of electronic devices involves identification of failure mechanisms and prediction of lifetimes. For parameter estimation and failure mode identification in ...
The original version of this story appeared in Quanta Magazine. In 1939, upon arriving late to his statistics course at UC Berkeley, George Dantzig—a first-year graduate student—copied two problems ...
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