The main objective of testing, when it comes to semiconductor manufacturing, is to provide a method of guaranteeing product quality. IC manufacturing tests go to the very heart of product reliability.

ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.

Artificial Intelligence has become a pervasive technology that is being applied to solve today’s complex problems, especially in the areas involving exponentially large amounts of data, their analysis ...