A new method in electron microscopy enables sub-20-picometer targeting of individual atoms without prior exposure, opening the door to atom-specific analysis and control. (Nanowerk Spotlight) ...
New ion beam fabrication uses low cost materials to form vertical nanomagnets whose nanostrip geometry boosts sensitivity to magnetic fields and current pulses. (Nanowerk News) Researchers at HZDR ...
As the name implies, the Short Beam Shear test subjects a beam to bending, just as flexural testing methods do, but the beam is very short relative to its thickness. For example, ASTM D 2344 1 ...
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